Laboratory Furnaces & Ovens
;; +RUL]RQ WDO;;;9HUWLFDO;7XEH;)XUQDFHV;;
;; %R[;)XUQDFHV;;; 2 YHQV
;; 7HPSHUDWXUHV;XS; WR;;;;;;&
;; 0DGH;LQ;WKH; 8; 6;$;
diSPIM FROM APPLIED SCIENTIFIC INSTRUMENTATION
The diSPIM system from ASI is an
extremely cell friendly system
for imaging live specimens as it
only illuminates the region of the
specimen that is being viewed,
reducing phototoxicity and reducing
photobleaching 7-10 fold. Unlike
other SPIM systems, the diSPIM allows
the use of conventional mounting and
Applied Scientific Instrumentation
DCC’s HotSpot Welder is a portable CD wire
welding unit that allows thermocouple wire to
be formed into free-standing beads or directly
welded to metal. It provides a quick, simple,
accurate, low-cost means of fabricating
thermocouples. View video of sample
operations and get specs and pricing on our
website. Put this flexibility to work for you.
MIL & QQ Standards
Gold, Silver, Rhodium, Palladium, Nickel,
Copper, Tin, Zinc.
Environmentally friendly, these low-cost
disposable applicators contain specially
formulated compounds and can be used
for contact repair, prototype development,
electronic instrument repair, medical instrument
Hunter Products Inc.
792 Partridge Drive, P.O. Box 6795, Bridgewater, NJ 08807-0795
800-524-0692, Fax: 908-526-8348
NEW SOLUTION SERIES FUME HOOD
The new SOLUTION SERIES fume hood
from Air Master Systems features a high
sightline frameless sash and a chain/sprocket
counterweight. More importantly, the hood
passed ASHRAE 110, NIH and EPA containment
testing at 60-100FPM face velocities. Along
with our metal casework, tables, and shelving
products, AMS can provide a complete metal
lab furniture project.
Air Master Systems Corp.
FAST, HIGHPERFORMANCE SDD DETEC TORS
Amptek’s highest performance Fast
SDD® silicon drift detectors are capable
of count rates over 1,000,000 CPS while
maintaining excellent resolution of
125 eV FWHM and typical peak-to-background ratio of 20,000:1. The FAST
SDD® is also available with Amptek’s
C-Series low energy windows for soft x-ray analysis.
FILM THICKNESS/BIREFRINGENCE/SPR CHARAC TERIZATION
The Model 2010/M prism coupler measures
thickness (±1%) and refractive index (±.0002)
in x, y, and z directions without matching
fluids for rigid or flexible films (max. index
3.35). Index at wavelengths from 405 to 1,550
nm and dn/d T up to 200 C can be measured.
Other applications include measuring
index of bulk materials and liquids, determination of crystallinity
and orientation in polymer materials, and characterization of surface
plasmon resonances and SPR shifts.